Reliability Analysis of Concentrator III-V Triple-Junction Solar Cells Using Arrhenius-Normal

This study builds upon the recently developed Arrhenius-Normal model to evaluate the reliability of commercial concentrator III–V triple-junction solar cells under thermal stress, based on accelerated lifetime data. The dataset, previously examined using the classical Arrhenius-Weibull and Arrhenius- Lognormal models, is reanalyzed to demonstrate that failure times at each stress level closely follow a normal distribution. The Arrhenius-Normal model exhibits an excellent fit to the stress–life relationship, enabling precise lifetime predictions under normal operating conditions. The analysis also confirms that while the mean and standard deviation of lifetime decrease with increasing stress, their ratio—the coefficient of variation—remains constant, aligning with findings in recent literature. The results are benchmarked against previously reported outcomes for validation and comparison.

Department

Electrical and Computer Engineering

Publisher

IEEE

Sponsor

NA

Open Access

https://repository.effatuniversity.edu.sa/handle/20.500.14131/2752

DOI

0.1109/ICPES68632.2025.11371810